DocumentCode
2539320
Title
Dark current reduction and operational wavelength shift in normal incidence InAs-GaAs QDIPs through the introduction of AlGaAs layers in the active region of the detector
Author
Baklenov, O. ; Chen, Z.H. ; Kim, E.T. ; Mukhametzhanov, I. ; Madhukar, A. ; Ma, F. ; Ye, Z. ; Yang, B. ; Campbell, J.
Author_Institution
Dept. of Mater. Sci., Univ. of Southern California, Los Angeles, CA, USA
fYear
2000
fDate
19-21 June 2000
Firstpage
171
Lastpage
172
Abstract
Self-assembled quantum dots (SAQDs) are an attractive alternative to quantum wells (QWs) for near to long-wavelength infrared photodetector applications. Due to the 3D carrier confinement and lack of symmetry-imposed selection rules, SAQDs are intrinsically sensitive to normal incidence photoexcitation and predicted to have lower dark current and higher sensitivity compared to QW intersubband photodetectors (Ryzhii, 1996), though the filling factor is substantially less for QDs than that for QWs. Initial reported results on normal-incidence QD intersubband photodetectors (e.g. Pan et al, 1998) offer encouragement for further investigations. In this report, we demonstrate the ability to reduce the dark current and to shift the operational wavelength of InAs-GaAs QD infrared photodetectors (QDIPs) through the introduction of AlGaAs barriers in the active region of the detector structure. AlGaAs layers are placed between the QD layers to act as blocking barriers for the dark current contribution through the region between the QDs.
Keywords
III-V semiconductors; aluminium compounds; dark conductivity; electric current; gallium arsenide; indium compounds; infrared detectors; photoexcitation; self-assembly; semiconductor device measurement; semiconductor quantum dots; 3D carrier confinement; AlGaAs; AlGaAs barriers; AlGaAs layers; InAs-GaAs; InAs-GaAs QD infrared photodetectors; QW intersubband photodetectors; SAQDs; blocking barriers; dark current; dark current reduction; detector active region; filling factor; infrared photodetector applications; normal incidence InAs-GaAs QDIPs; normal incidence photoexcitation; normal-incidence QD intersubband photodetectors; operational wavelength; operational wavelength shift; quantum wells; self-assembled quantum dots; sensitivity; symmetry-imposed selection rules; Carrier confinement; Dark current; Gallium arsenide; Infrared detectors; Materials science and technology; Microelectronics; Photoconductivity; Photodetectors; Quantum dots; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 2000. Conference Digest. 58th DRC
Conference_Location
Denver, CO, USA
Print_ISBN
0-7803-6472-4
Type
conf
DOI
10.1109/DRC.2000.877135
Filename
877135
Link To Document