DocumentCode :
2539549
Title :
Physically based analytical modeling of base-collector charge, capacitance and transit time of III-V HBT´s
Author :
Van der Toorn, Ramses ; Paasschens, Jeroen C J ; Havens, Ramon J.
Author_Institution :
Philips Res. Labs., Eindhoven, Netherlands
fYear :
2004
fDate :
24-27 Oct. 2004
Firstpage :
283
Lastpage :
286
Abstract :
We present two complementary, analytical calculations of the electric field, stored charge, capacitance and transit time of the collector of a III-V HBT, for respectively low- and high bias regimes. Voltage, current and temperature dependence of base-collector capacitance as well as fT-peaking at high bias is thus quantitatively related to GaAs-like electron drift-velocity characteristics. The physical insight developed serves as a basis for extension of the Mextram compact bipolar transistor model for circuit simulation.
Keywords :
III-V semiconductors; heterojunction bipolar transistors; semiconductor device models; GaAs-like electron drift-velocity characteristics; III-V HBT; Mextram; base-collector capacitance; base-collector charge modelling; circuit simulation; collector capacitance; compact bipolar transistor model; physically based analytical modeling; transit time; Analytical models; Bipolar transistors; Capacitance; Electrons; Gallium arsenide; Heterojunction bipolar transistors; Hip; III-V semiconductor materials; Temperature dependence; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium, 2004. IEEE
ISSN :
1550-8781
Print_ISBN :
0-7803-8616-7
Type :
conf
DOI :
10.1109/CSICS.2004.1392568
Filename :
1392568
Link To Document :
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