DocumentCode :
2539731
Title :
Wafer-level fabrication of nanoscale patterned sapphire substrates with broadband optical transmittance
Author :
Lin, Yu-Sheng ; Yeh, J. Andrew
Author_Institution :
Inst. of NanoEngineering & Microsyst., Nat. Tsing-Hua Univ., Hsinchu, Taiwan
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
641
Lastpage :
644
Abstract :
This paper presents wafer-level aperiodic nanostructures fabrication of sapphire substrates with broadband optical transmittance. The nanostructures were patterned by using nickel silicide as a hard mask, and performed by inductively coupled plasma reactive ion etching. The sapphire substrates with nanostructures exhibit high transmittance at wide incident angles over broadband spectra compared with conventional sapphire substrates. The transmittance of visible to near-IR spectra was found to be 94%. In the mid-IR spectrum, the transmittance exceeds 88% until the reflection is no longer suppressed by nanostructures. The polarization properties show the nanostructure enhances the reflectivity ratio by at least 50%.
Keywords :
infrared spectra; nanofabrication; nanopatterning; reflectivity; sapphire; ultraviolet spectra; visible spectra; Al2O3; broadband optical transmittance; nanoscale patterned sapphire substrates; plasma reactive ion etching; polarization property; reflectivity ratio; visible-near-IR spectra; wafer-level aperiodic nanostructure fabrication; Broadband communication; Cascading style sheets; Gallium nitride; Integrated optics; Optical device fabrication; Optical polarization; Optical reflection; Patterned sapphire; broadband transmittance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location :
Beijing
ISSN :
Pending
Print_ISBN :
978-1-4577-0157-3
Type :
conf
DOI :
10.1109/TRANSDUCERS.2011.5969788
Filename :
5969788
Link To Document :
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