DocumentCode :
2540185
Title :
Ambipolar Si nanowire field effect transistors for low current and temperature sensing
Author :
Sacchetto, D. ; De Micheli, G. ; Leblebici, Y.
Author_Institution :
EPFL - Ecole Polytech. Fed., Lausanne, Switzerland
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
2562
Lastpage :
2565
Abstract :
This paper reports on the fabrication and characterization of a pA current and temperature sensing device with ultra-low power consumption based on a Schottky barrier silicon nanowire transistor. Thermionic and trap-assisted tunneling current conduction mechanisms are identified and discussed on the base of the device sensitivity upon current and temperature biasing. In particular, very low current sensing properties are confirmed also with previously reported polysilicon-channel nanowire Schottky barrier transistors. demonstrating that these devices are suitable for temperature and current sensing applications. Moreover, the process flow compatibility for both sensing and logic applications makes these devices suitable for heterogeneous integration.
Keywords :
Schottky barriers; electric sensing devices; elemental semiconductors; field effect transistors; low-power electronics; nanowires; silicon; temperature sensors; tunnelling; ambipolar silicon nanowire field effect transistor; current biasing; device sensitivity; low current sensing; polysilicon channel nanowire Schottky barrier transistor; temperature biasing; temperature sensing; trap-assisted tunneling current conduction mechanism; ultra-low power consumption; FETs; Logic gates; Schottky barriers; Silicon; Temperature sensors; Tunneling; FET; Schottky barrier; ambipolar; nanowire; sensing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location :
Beijing
ISSN :
Pending
Print_ISBN :
978-1-4577-0157-3
Type :
conf
DOI :
10.1109/TRANSDUCERS.2011.5969815
Filename :
5969815
Link To Document :
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