DocumentCode
2540471
Title
A Short-term User Interest Model for personalized recommendation
Author
Yu, Jie ; Liu, Fangfang
Author_Institution
Sch. of Comput. Eng. & Sci., Shanghai Univ., Shanghai, China
fYear
2010
fDate
16-18 April 2010
Firstpage
219
Lastpage
222
Abstract
Personalized recommendation is a widely used application of Web personalized services which alleviate the burden of information overload by collecting information which meets user´s needs. An essential of personalized recommendation is how to describe and obtain user´s interests. Most existing approaches try to obtain interests from user´s whole process of browsing. However, effective obtainment, storage and organization are challenging issues. In this paper, Short-term User Interest Model (SUIM) is presented to represent user´s real-time interests based on his/her recent browsing content and behavior. On one hand, based on Semantic Link Network (SLN), user´s real-time interests are semantically represented by Web pages he/she has browsed. The contribution of each page to representation of user´s interests is weighted by information entropy based on associated degree from this Web page to other ones. On the other hand, memory capacity and recall probability from psychology are introduced to ensure the small scale and accuracy of SUIM. Experimental results show the validity of SUIM. The proposed method has a brilliant perspective in the applications of Web personalized recommendation.
Keywords
Web services; recommender systems; Web pages; Web personalized recommendation; information collection; information overload; memory capacity; recall probability; semantic link network; short-term user interest model; Application software; Capacity planning; Fusion power generation; Fuzzy sets; Information entropy; Psychology; Qualifications; Search engines; Web pages; Weight measurement; information entropy; memory capacity; short-term user´s interest;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Management and Engineering (ICIME), 2010 The 2nd IEEE International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-5263-7
Electronic_ISBN
978-1-4244-5265-1
Type
conf
DOI
10.1109/ICIME.2010.5477448
Filename
5477448
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