• DocumentCode
    2540695
  • Title

    Classification for Striation Patterns Using the Synthetical Feature Vector Based on SVM

  • Author

    Min Yang ; Li Mou ; Wei-Dong Wang

  • Author_Institution
    Dept. of Forensic Sci., Guangdong Police Coll., Guangzhou, China
  • fYear
    2009
  • fDate
    4-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    With the advent of high-efficiency technology of digital image processing and pattern classification, the research on classification for tool marks is catching forensic scientist´s eyes. It is crucial for classification to extract and select the features from tool marks. In the practical situation, the geometrical shapes and the textures of tool marks are complex, irregular and stochastic. It is difficult to represent the tool mark using a single feature. A new approach of the feature extracting and representation is presented. It computes multi-scale extended fractal features and morphological structure features which are constructed into a synthetical feature vector. The vector is utilized to classify the striation patterns after the reduction of its dimensionality based on SVM. Experimental result shows that the method presented is effective for classification of striation patterns.
  • Keywords
    feature extraction; forensic science; fractals; image classification; image representation; image texture; mathematical morphology; support vector machines; digital image processing; feature extraction; feature representation; forensics; geometrical shape; image texture; morphological structure features; multiscale extended fractal features; striation pattern classification; support vector machine; synthetical feature vector; tool mark; Digital images; Eyes; Feature extraction; Forensics; Fractals; Pattern classification; Shape; Stochastic processes; Support vector machine classification; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2009. CCPR 2009. Chinese Conference on
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-4199-0
  • Type

    conf

  • DOI
    10.1109/CCPR.2009.5343979
  • Filename
    5343979