Title :
Analysis of X-cut lithium niobate electrooptic modulators with backside slots
Author :
Hassan, M. Khaled ; Alam, M. Shah
Author_Institution :
Dept. of Electr. & Comput. Eng., Presidency Univ., Dhaka
Abstract :
A detailed microwave analysis of X-cut LiNbO3 (LN) electrooptical (EO) modulators is presented in this paper by using the finite element method (FEM). The two-step back-slot structure considered here satisfies the velocity matching condition and eliminates the necessity of buffer layer of silicon dioxide (SiO2) which is necessary for the ridge type Z-cut LiNbO3 modulators. The optical 3-dB bandwidth and the effect of microwave loss on the bandwidth are shown in this paper. It has been shown that, an optical 3-dB bandwidth of more than 140 GHz can be achieved with X-cut LiNbO3 substrate, when back side slots are incorporated in the structure.
Keywords :
electro-optical modulation; finite element analysis; lithium compounds; microwave measurement; microwave photonics; optical losses; optical materials; FEM; LiNbO3; MZI modulator; X-cut lithium niobate electrooptic modulators; finite element method; loss 3 dB; microwave analysis; microwave loss; optical bandwidth; two-step backside-slot structure; velocity matching condition; Bandwidth; Buffer layers; Electrooptic modulators; Finite element methods; Lithium niobate; Microwave theory and techniques; Optical buffering; Optical losses; Optical modulation; Silicon compounds;
Conference_Titel :
Electrical and Computer Engineering, 2008. ICECE 2008. International Conference on
Conference_Location :
Dhaka
Print_ISBN :
978-1-4244-2014-8
Electronic_ISBN :
978-1-4244-2015-5
DOI :
10.1109/ICECE.2008.4769270