DocumentCode :
2541743
Title :
A numerical analysis of PV-rating methods
Author :
Nann, Stefan ; Emery, Keith
Author_Institution :
Centre for Energy & Hydrogen Res., Stuttgart, Germany
fYear :
1991
fDate :
7-11 Oct 1991
Firstpage :
789
Abstract :
A computer model has been developed to simulate solar cell power production from meteorological data and solar cell measurements. A novel feature of this model is that it calculates the hourly solar irradiance for clear and cloudy skies from readily available meteorological data. The investigation includes a monocrystalline silicon and GaAs cell and the thin-film cells CdS/CdTe, CdS/CuInSe2, a-Si:H, and a two-terminal a-Si:H/a-Si:H/a-SiGe:H device. This study includes spectra under cloudy skies to study in detail the effect of variations in the solar spectral irradiance on the device´s efficiency. A second intention of this work is to analyze the sensitivity of different power and energy rating methods to spectral irradiance, total irradiance, and cell temperature. As a result, a multivalue energy rating scheme applying the concept of critical operation conditions is proposed and compared with the current single-value power rating procedure under standard reporting conditions
Keywords :
digital simulation; electrical engineering computing; numerical analysis; semiconductor device models; solar cells; CdS-CdTe; CdS-CuInSe2; GaAs; Si; Si:H; Si:H-Si:H-SiGe:H; cell temperature; cloudy skies; digital simulation; efficiency; hourly solar irradiance; monocrystalline; multivalue energy rating scheme; numerical analysis; semiconductor device models; sensitivity; solar cells; solar spectral irradiance; total irradiance; Computational modeling; Computer simulation; Gallium arsenide; Meteorology; Numerical analysis; Photovoltaic cells; Power measurement; Production; Semiconductor thin films; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-87942-636-5
Type :
conf
DOI :
10.1109/PVSC.1991.169317
Filename :
169317
Link To Document :
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