DocumentCode
2542133
Title
Proceedings of International Workshop on Defect and Fault Tolerance in VLSI
fYear
1995
fDate
13-15 Nov. 1995
Abstract
The following topics were dealt with: critical area analysis; defect sensitivity and reliability; fault tolerant architectures; fault tolerant arrays; yield projection and enhancement; fault tolerant techniques; testing techniques; self checking and coding techniques
Keywords
VLSI; automatic testing; encoding; fault diagnosis; fault tolerant computing; integrated circuit reliability; integrated circuit testing; integrated circuit yield; logic testing; VLSI systems; coding techniques; critical area analysis; defect sensitivity; fault tolerant architectures; fault tolerant arrays; fault tolerant techniques; reliability; self checking; testing techniques; yield enhancement; yield projection;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1995. Proceedings., 1995 IEEE International Workshop on,
Conference_Location
Lafayette, LA, USA
ISSN
1550-5774
Print_ISBN
0-8186-7107-6
Type
conf
DOI
10.1109/DFTVS.1995.476930
Filename
476930
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