DocumentCode :
2542137
Title :
Performance Evaluation of SiC MOSFET/BJT/Schottky Diode in A 1MHz Single Phase PFC
Author :
Xu, Xiaojun ; Huang, Alex Q. ; Gao, Yan ; Agarwal, Anant ; Krishnaswami, Sumi ; Ryu, Sei-Hyang ; Huang, Xu
Author_Institution :
Semiconductor Power Electronics Center (SPEC), North Carolina State University, Raleigh, NC 27695
fYear :
2007
fDate :
Feb. 25 2007-March 1 2007
Firstpage :
1268
Lastpage :
1272
Abstract :
SiC power devices have very promising future because their ultra low conduction and switching losses and ability of working at high temperatures. SiC MOSFET not only has very low switching loss but also shows no degradation in Rdson at 150°C. In order to achieve ultra low switching loss for SiC BJT, a new drive method is proposed and implemented. These characteristics make SiC power MOSFET/BJT devices attractive for high frequency single phase PFC applications. In this paper, a 1MHz all SiC PFC is designed and evaluated. Experimental results are presented in this paper. These results are also compared with silicon CoolMOS.
Keywords :
Capacitance; Frequency; MOSFET circuits; Power MOSFET; Power electronics; Schottky diodes; Silicon carbide; Switching loss; Temperature; Voltage; 1MHz PFC; SiC BJT; SiC MOSFET; SiC Schottky Diode; high frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference, APEC 2007 - Twenty Second Annual IEEE
Conference_Location :
Anaheim, CA, USA
ISSN :
1048-2334
Print_ISBN :
1-4244-0713-3
Type :
conf
DOI :
10.1109/APEX.2007.357678
Filename :
4195881
Link To Document :
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