DocumentCode
2542137
Title
Performance Evaluation of SiC MOSFET/BJT/Schottky Diode in A 1MHz Single Phase PFC
Author
Xu, Xiaojun ; Huang, Alex Q. ; Gao, Yan ; Agarwal, Anant ; Krishnaswami, Sumi ; Ryu, Sei-Hyang ; Huang, Xu
Author_Institution
Semiconductor Power Electronics Center (SPEC), North Carolina State University, Raleigh, NC 27695
fYear
2007
fDate
Feb. 25 2007-March 1 2007
Firstpage
1268
Lastpage
1272
Abstract
SiC power devices have very promising future because their ultra low conduction and switching losses and ability of working at high temperatures. SiC MOSFET not only has very low switching loss but also shows no degradation in Rdson at 150°C. In order to achieve ultra low switching loss for SiC BJT, a new drive method is proposed and implemented. These characteristics make SiC power MOSFET/BJT devices attractive for high frequency single phase PFC applications. In this paper, a 1MHz all SiC PFC is designed and evaluated. Experimental results are presented in this paper. These results are also compared with silicon CoolMOS.
Keywords
Capacitance; Frequency; MOSFET circuits; Power MOSFET; Power electronics; Schottky diodes; Silicon carbide; Switching loss; Temperature; Voltage; 1MHz PFC; SiC BJT; SiC MOSFET; SiC Schottky Diode; high frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference, APEC 2007 - Twenty Second Annual IEEE
Conference_Location
Anaheim, CA, USA
ISSN
1048-2334
Print_ISBN
1-4244-0713-3
Type
conf
DOI
10.1109/APEX.2007.357678
Filename
4195881
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