• DocumentCode
    2542434
  • Title

    Analysis and optimization of active frequency drift islanding detection method

  • Author

    Liu, Furong ; Kang, Yong ; Duan, Shanxu

  • Author_Institution
    Department of Electrical and Electric engineering, Huazhong University of Science and Technology; Department of Automation, Wuhan University of Technology, 430074 Wuhan, P.R. CHINA. lfr@mail.whut.edu.cn
  • fYear
    2007
  • fDate
    Feb. 25 2007-March 1 2007
  • Firstpage
    1379
  • Lastpage
    1384
  • Abstract
    Unintentional islanding of distributed generation (DG) cause negative impacts on distribution systems and must be detected within acceptable durations. To certify the anti-islanding performance of DG systems, IEEE Std. 929-2000 [1] issued a standardized test procedure to distinguish an inverter with an adequate anti-islanding technique from those without. Lab testing is an effective way to judge the anti-islanding performance, although the process is time costing and any little mistake (like poor tuned RLC load) may mislead the judgement. This makes anti-islanding schemes comparison difficult. Non-detection zone (NDZ) is an effective performance index to evaluate anti-islanding schemes. This paper proposes a novel NDZ mapping method that set up relations between NDZ and IEEE Std. 929-2000 testing requirement. It maps the NDZ into load space that characterized by "power quality" and load capacitance. Based on the NDZ plot, not only the dominate factors that influence anti-islanding protection performance can be identified, but also optimized parameter setting of the anti-islanding schemes can be deduced, that helps to achieve the "non-islanding inverter" as well as least potential adverse impact on power quality.
  • Keywords
    Capacitance; Costing; Distributed control; Frequency; Inverters; Optimization methods; Performance analysis; Power quality; Protection; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference, APEC 2007 - Twenty Second Annual IEEE
  • Conference_Location
    Anaheim, CA, USA
  • ISSN
    1048-2334
  • Print_ISBN
    1-4244-0713-3
  • Type

    conf

  • DOI
    10.1109/APEX.2007.357696
  • Filename
    4195899