Title :
Clothing Co-parsing by Joint Image Segmentation and Labeling
Author :
Wei Yang ; Ping Luo ; Liang Lin
Author_Institution :
Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Abstract :
This paper aims at developing an integrated system of clothing co-parsing, in order to jointly parse a set of clothing images (unsegmented but annotated with tags) into semantic configurations. We propose a data-driven framework consisting of two phases of inference. The first phase, referred as "image co-segmentation", iterates to extract consistent regions on images and jointly refines the regions over all images by employing the exemplar-SVM (ESVM) technique [23]. In the second phase (i.e. "region colabeling"), we construct a multi-image graphical model by taking the segmented regions as vertices, and incorporate several contexts of clothing configuration (e.g., item location and mutual interactions). The joint label assignment can be solved using the efficient Graph Cuts algorithm. In addition to evaluate our framework on the Fashionista dataset [30], we construct a dataset called CCP consisting of 2098 high-resolution street fashion photos to demonstrate the performance of our system. We achieve 90.29% / 88.23% segmentation accuracy and 65.52% / 63.89% recognition rate on the Fashionista and the CCP datasets, respectively, which are superior compared with state-of-the-art methods.
Keywords :
clothing; electronic commerce; feature extraction; graph theory; image resolution; image segmentation; support vector machines; CCP dataset; E-SVM technique; Fashionista dataset; clothing co-parsing; clothing configuration; clothing images; consistent region extraction; data-driven framework; exemplar-SVM technique; graph cut algorithm; high-resolution street fashion photos; image co-segmentation; image labeling; image segmentation; joint label assignment; multiimage graphical model; region co-labeling; Clothing; Context; Graphical models; Image edge detection; Image segmentation; Labeling; Training; Clothing Recognition; EM Algorithm; Human Parsing; Image Understand;
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2014 IEEE Conference on
Conference_Location :
Columbus, OH
DOI :
10.1109/CVPR.2014.407