• DocumentCode
    2542643
  • Title

    Fully programmable bias current generator with 24 bit resolution per bias

  • Author

    Delbrück, Tobi ; Lichtsteiner, Patrick

  • Author_Institution
    Inst. of Neuroinformatics, UNI-ETH, Zurich
  • fYear
    2006
  • fDate
    21-24 May 2006
  • Lastpage
    2852
  • Abstract
    This paper describes an on-chip programmable bias current generator, intended for mixed signal chips requiring a wide ranging set of currents. The individual generators share a master current reference. A serial digital interface to the chip controls the biases by bits loaded into a 24-bit shift register. These bits control the steering of current from a current splitter. The summed current splitter output is actively mirrored to a broadcasted bias voltage. Measurements from an implementation in 0.35mu 4M-2P CMOS show a total range of bias current of over 6 decades (>120 dB) ranging from a few times the off-current up to the master reference current. For currents larger than the minimum, the generator has resolution spanning nearly its full 24 bit range (144dB), e.g. for a master current of 10 muA, any bias current can be varied by as little as 0.5 pA with the caveat that the code is not guaranteed monotonic. Each bias occupies an area of 0.026 mm2 , which is about 65% of the bonding pad that it replaces. Measured variation in generated currents is <10% in strong inversion and about 20-30% in weak inversion
  • Keywords
    CMOS integrated circuits; digital-analogue conversion; mixed analogue-digital integrated circuits; power electronics; programmable circuits; reference circuits; shift registers; 24 bit; 4M-2P CMOS process; current splitter; mixed signal chips; on-chip programmable bias current generator; serial digital interface; shift register; Circuits; Costs; Current measurement; Latches; Resistors; Shift registers; Strontium; Testing; Universal Serial Bus; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
  • Conference_Location
    Island of Kos
  • Print_ISBN
    0-7803-9389-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2006.1693218
  • Filename
    1693218