DocumentCode :
254307
Title :
Similarity-Aware Patchwork Assembly for Depth Image Super-resolution
Author :
Jing Li ; Zhichao Lu ; Gang Zeng ; Rui Gan ; Hongbin Zha
Author_Institution :
Key Lab. on Machine Perception, Peking Univ., Beijing, China
fYear :
2014
fDate :
23-28 June 2014
Firstpage :
3374
Lastpage :
3381
Abstract :
This paper describes a patchwork assembly algorithm for depth image super-resolution. An input low resolution depth image is disassembled into parts by matching similar regions on a set of high resolution training images, and a super-resolution image is then assembled using these corresponding matched counterparts. We convert the super resolution problem into a Markov Random Field (MRF) labeling problem, and propose a unified formulation embedding (1) the consistency between the resolution enhanced image and the original input, (2) the similarity of disassembled parts with the corresponding regions on training images, (3) the depth smoothness in local neighborhoods, (4) the additional geometric constraints from self-similar structures in the scene, and (5) the boundary coincidence between the resolution enhanced depth image and an optional aligned high resolution intensity image. Experimental results on both synthetic and real-world data demonstrate that the proposed algorithm is capable of recovering high quality depth images with X4 resolution enhancement along each coordinate direction, and that it outperforms state-of-the-arts [14] in both qualitative and quantitative evaluations.
Keywords :
Markov processes; image enhancement; image matching; image resolution; random processes; MRF labeling problem; Markov random field labeling problem; boundary coincidence; depth image super-resolution; geometric constraints; input low resolution depth image; qualitative evaluation; quantitative evaluation; resolution enhancement; self-similar structures; similar region matching; similarity-aware patchwork assembly; Assembly; DH-HEMTs; Databases; Energy resolution; Image edge detection; Image resolution; Training; Assembly; Disassemble; Dpeth map super resolution; Self-similarity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2014 IEEE Conference on
Conference_Location :
Columbus, OH
Type :
conf
DOI :
10.1109/CVPR.2014.431
Filename :
6909827
Link To Document :
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