Title :
Active-region-cutout-enclosed-layout-transistor device applications in electronics
Author :
Binzaid, Shuza ; Attia, John O.
Author_Institution :
Department of Electrical and Computer Engineering, Prairie View A&M University, Prairie View, Texas 78446, USA
Abstract :
ARC technique was developed and latter a HBD ELT was modified with ARCs. The new MOSFET was called ARCELT, which contains three electrodes and thus it became a compound MOSFET having three transistors within it. Relationship between transistors in ARCELT and ARCs is established. The effective area of each transistor reduced to almost 33% of ELT. Some special application techniques of ARCELT in electronic circuits are studied and implemented. Technique to calculate and control device aspect ratio, W/L is found to approximate the value. Special technique is needed to make equivalent device of the ARCELT for SPICE circuit simulation. ARCELT reduces electronic circuit´s size; thus saves silicon space and improves IC´s design density.
Keywords :
Application software; DH-HEMTs; Electrodes; Electronic circuits; Interference; MOS devices; MOSFET circuits; Radiation hardening; Silicon; Space technology; Active-region-cutout (ARC), enclosed-layout-transistor (ELT), Active-region-cutout-enclosed-layout-transistor (ARCELT), hardened-by-design (HBD), integrated circuit (IC);
Conference_Titel :
Electrical and Computer Engineering, 2008. ICECE 2008. International Conference on
Conference_Location :
Dhaka
Print_ISBN :
978-1-4244-2014-8
Electronic_ISBN :
978-1-4244-2015-5
DOI :
10.1109/ICECE.2008.4769347