DocumentCode :
2543385
Title :
Functionally expanded phase-change memory: experiments on light influence on threshold voltage
Author :
Asokan, S. ; Savransky, S.D. ; Pattanayak, Pulok ; Anbarasu, M.
Author_Institution :
Indian Inst. of Sci., Bangalore
fYear :
2005
fDate :
10-10 Nov. 2005
Lastpage :
71
Abstract :
We describe the first experimental results of a light influence on the threshold voltage Vt in new ternary lead-free telluride compound (labeled as SA1). Reduction of Vt on about 35% in SA1 illuminated by Ar ion laser to compare dark Vt is discovered. More than 10,000 switching cycles without degradation have been recorded. Variation of the laser power allows achieving Vt reduction in SA1 down to 40% from the dark level. This is the largest change of Vt known for amorphous chalcogenides. It opens new horizons for chalcogenide functionally expanded phase change memory. Some ideas about the mechanism of the observed effect, related with the photo-generation of charge carriers and possible mechanisms of transition from OFF state to ON state, are discussed
Keywords :
chalcogenide glasses; phase change materials; random-access storage; amorphous chalcogenides; charge carriers; functionally expanded phase-change memory; ion laser; laser power; photo-generation; telluride alloys; ternary lead-free telluride compound; threshold switching; threshold voltage; Amorphous materials; Argon; Degradation; Environmentally friendly manufacturing techniques; Glass; Lead; Phase change memory; Phase change random access memory; Power lasers; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Non-Volatile Memory Technology Symposium, 2005
Conference_Location :
Dallas, TX
Print_ISBN :
0-7803-9408-9
Type :
conf
DOI :
10.1109/NVMT.2005.1541402
Filename :
1541402
Link To Document :
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