DocumentCode
2543385
Title
Functionally expanded phase-change memory: experiments on light influence on threshold voltage
Author
Asokan, S. ; Savransky, S.D. ; Pattanayak, Pulok ; Anbarasu, M.
Author_Institution
Indian Inst. of Sci., Bangalore
fYear
2005
fDate
10-10 Nov. 2005
Lastpage
71
Abstract
We describe the first experimental results of a light influence on the threshold voltage Vt in new ternary lead-free telluride compound (labeled as SA1). Reduction of Vt on about 35% in SA1 illuminated by Ar ion laser to compare dark Vt is discovered. More than 10,000 switching cycles without degradation have been recorded. Variation of the laser power allows achieving Vt reduction in SA1 down to 40% from the dark level. This is the largest change of Vt known for amorphous chalcogenides. It opens new horizons for chalcogenide functionally expanded phase change memory. Some ideas about the mechanism of the observed effect, related with the photo-generation of charge carriers and possible mechanisms of transition from OFF state to ON state, are discussed
Keywords
chalcogenide glasses; phase change materials; random-access storage; amorphous chalcogenides; charge carriers; functionally expanded phase-change memory; ion laser; laser power; photo-generation; telluride alloys; ternary lead-free telluride compound; threshold switching; threshold voltage; Amorphous materials; Argon; Degradation; Environmentally friendly manufacturing techniques; Glass; Lead; Phase change memory; Phase change random access memory; Power lasers; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Non-Volatile Memory Technology Symposium, 2005
Conference_Location
Dallas, TX
Print_ISBN
0-7803-9408-9
Type
conf
DOI
10.1109/NVMT.2005.1541402
Filename
1541402
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