• DocumentCode
    2543596
  • Title

    Critical area extraction of extra material soft faults

  • Author

    Allan, Gerard A. ; Walton, Anthony J.

  • Author_Institution
    Dept. of Electr. Eng., Edinburgh Univ., UK
  • fYear
    1995
  • fDate
    13-15 Nov 1995
  • Firstpage
    55
  • Lastpage
    62
  • Abstract
    A method of extracting the extra material critical area of soft faults from an integrated circuit layout is presented. This has been implemented in the EYE tool allowing efficient extraction of the critical area from arbitrary mask layout. Results comparing defect sensitivity of a routing network modified to reduce defect sensitivity are reported. The application to defect related reliability is explored
  • Keywords
    fault diagnosis; integrated circuit layout; integrated circuit reliability; EYE tool; critical area extraction; defect sensitivity; extra material soft faults; integrated circuit layout; mask layout; reliability; routing network; Application software; Circuit faults; Circuit testing; Computer network reliability; Design for quality; Integrated circuit layout; Integrated circuit reliability; Routing; Telecommunication network reliability; Telephony;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1995. Proceedings., 1995 IEEE International Workshop on,
  • Conference_Location
    Lafayette, LA
  • ISSN
    1550-5774
  • Print_ISBN
    0-8186-7107-6
  • Type

    conf

  • DOI
    10.1109/DFTVS.1995.476937
  • Filename
    476937
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2543596