A model for the evaluation of fault tolerance in the FERMI system

Author

Antola, Anna ; Breveglieri, Luca

Author_Institution

Dipartimento di Elettronica e Inf., Politecnico di Milano, Italy

fYear

1995

fDate

13-15 Nov 1995

Firstpage

72

Lastpage

80

Abstract

Experiments of high energy physics planned at the Large Hadron Collider (LHC) at CERN (CH) require digital data acquisition systems with high throughput. Such systems need also be fault tolerant to the permanent and transient faults induced by radiation, since they must be installed close to the experiment area. A model for the evaluation of the fault tolerance performances of the most significant VLSI devices designed for the construction of the FERMI system, a data acquisition system for the LHC, is presented. The model allows one to quantify the probability of the FERMI system to survive fatal failures, to increase mission time and to provide valid data for different implementations of fault tolerance

Keywords

VLSI; data acquisition; fault tolerant computing; high energy physics instrumentation computing; nuclear electronics; FERMI microsystem; Large Hadron Collider; VLSI devices; digital data acquisition system; fault tolerance; high energy physics; model; radiation effects; Data acquisition; Dynamic range; Educational institutions; Electronic mail; Fault tolerance; Fault tolerant systems; Large Hadron Collider; Performance evaluation; Throughput; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 1995. Proceedings., 1995 IEEE International Workshop on,

Conference_Location

Lafayette, LA

ISSN

1550-5774

Print_ISBN

0-8186-7107-6

Type

conf

DOI

10.1109/DFTVS.1995.476939

Filename

476939