Title :
Design of a resistorless ASIC preamplifier for HPGe detectors with non-linear pole/zero cancellation and controlled fast-reset feature
Author :
Pullia, A. ; Capra, S.
Author_Institution :
Dept. of Phys., Univ. of Milano, Milan, Italy
fDate :
Oct. 27 2012-Nov. 3 2012
Abstract :
An original low-noise ASIC preamplifier is under development for high-resolution gamma-ray spectroscopy with germanium or other semiconductor detectors. The preamplifier is being designed in a 0.35 J.lm 5V CMOS technology, uses no feedback resistor and incorporates original techniques to optimize its performance. The first novelty consists of a nonstandard circuit structure for non-linear pole-zero compensation, aimed at removing the non-linear behaviour of the continuous non-resistive charge reset mechanism. The second consists of a controlled fast-reset feature aimed at greatly reducing the dead time caused by hits of high-energy charged particles. Such events are typical in nuclear physics experiments employing radioactive ion beams and in fusion-evaporation reactions which yield a prolonged saturation of the system that prevents detection of the subsequent decay events. The peculiar features of this preamplifier could be also exploited in other applications employing semiconductor detectors.
Keywords :
CMOS integrated circuits; application specific integrated circuits; gamma-ray spectroscopy; germanium radiation detectors; high energy physics instrumentation computing; radioactive ion beams; CMOS technology; HPGe detectors; continuous nonresistive charge reset mechanism; controlled fast-reset feature; feedback resistor; fusion-evaporation reaction; gamma-ray spectroscopy; high-energy charged particles; low-noise ASIC preamplifier; nonlinear pole-zero compensation; nonlinear pole/zero cancellation; nonstandard circuit structure; nuclear physics experiment; radioactive ion beams; resistorless ASIC preamplifier; semiconductor detector; subsequent decay events; voltage 5 V;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-2028-3
DOI :
10.1109/NSSMIC.2012.6551066