DocumentCode
254435
Title
A 40nm/65nm process adaptive low jitter phase-locked loop
Author
Yuan Hengzhou ; Guo Yang ; Ma Zhuo
Author_Institution
Sch. of Comput. Sci., Nat. Univ. of Defense Technol., Changsha, China
fYear
2014
fDate
10-12 Dec. 2014
Firstpage
500
Lastpage
503
Abstract
As the chip performance improved, low jitter PLL is getting more attention. The migration of process requires more stability of PLL among different processes. In this paper, by depressing the non-ideality of charge-pump and setting the two-stage control voltage of VCO, the noise performance of PLL is improved. The self-adaptive bandwidth technology is used to decrease the dependency between process and performance. The simulation proves that this PLL can adapt to both 40nm and 65nm process. The chip is taped out under 40nm CMOS process, the phase-noise performance of this PLL is -130dBc/Hz@3MHz at 1GHz, the maximum VCO output is up to 3.2GHz, the lowest resolution is 0.048Hz, which guarantees the high versatility and high performance of this PLL.
Keywords
CMOS integrated circuits; MMIC oscillators; UHF integrated circuits; UHF oscillators; charge pump circuits; circuit stability; integrated circuit noise; jitter; phase locked loops; phase noise; voltage control; voltage-controlled oscillators; CMOS process; PLL; VCO; charge-pump; frequency 0.048 Hz; frequency 1 GHz; frequency 3 MHz; phase-noise performance; process adaptive low jitter phase-locked loop; self-adaptive bandwidth technology; size 40 nm; size 65 nm; two-stage control voltage; Bandwidth; Charge pumps; Jitter; Noise; Phase locked loops; Voltage control; Voltage-controlled oscillators; Low Jitter; Phase-Locked Loop; Process-Adaptive;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Circuits (ISIC), 2014 14th International Symposium on
Conference_Location
Singapore
Type
conf
DOI
10.1109/ISICIR.2014.7029450
Filename
7029450
Link To Document