• DocumentCode
    2544539
  • Title

    Bisection Based Placement for the X Architecture

  • Author

    Ono, Satoshi ; Tilak, Sameer ; Madden, Patrick H.

  • Author_Institution
    Dept. of Comput. Sci., SUNY, Binghamton, NY
  • fYear
    2007
  • fDate
    23-26 Jan. 2007
  • Firstpage
    153
  • Lastpage
    158
  • Abstract
    Rising interconnect delay and power consumption have motivated the investigation of alternative integrated circuit routing architectures. In particular, the X architecture, which features preferred routing in diagonal directions, has gained a measure of industry support, and has even been validated at 65nm. While there has been extensive study of Manhattan design methods, there are markedly fewer published results for non-Manhattan design. To help fill this gap, we study a patented placement method for the X architecture; to our knowledge, there have been no prior published results for the method. Surprisingly, we find that the patented method in fact performs worse than traditional Manhattan methods - for both Manhattan and X routing metrics. We also present a theoretic formulation which explains why solution quality is degraded. Many groups in industry are evaluating the merits of non-Manhattan routing architectures. By providing concrete experimental results, we hope to improve the accuracy of these evaluations.
  • Keywords
    integrated circuit interconnections; integrated circuit layout; nanotechnology; network routing; X architecture; bisection based placement; integrated circuit routing architectures; nonManhattan routing architectures; patented placement method; Concrete; Degradation; Delay; Design methodology; Energy consumption; Gain measurement; Integrated circuit interconnections; Integrated circuit measurements; Particle measurements; Routing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    1-4244-0629-3
  • Electronic_ISBN
    1-4244-0630-7
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2007.357978
  • Filename
    4196024