• DocumentCode
    2544609
  • Title

    Improving performance of fast high resolution LaBr3 scintillation detectors in case of pulse pile-up effects

  • Author

    Riboldi, S. ; Brambilla, S. ; Boiano, C. ; Camera, F.

  • Author_Institution
    Univ. degli Studi di Milano, Milan, Italy
  • fYear
    2012
  • fDate
    Oct. 27 2012-Nov. 3 2012
  • Firstpage
    253
  • Lastpage
    256
  • Abstract
    Pulse pile-up, even at moderate rate of incoming events (20-30 kcps) can significantly degrade the performance of Lanthanum bromide (LaBr3) scintillators with respect to their very good energy resolution. A working array of 10 large LaBr3 detectors is available in Milano and we are currently going to improve the existing associated electronics for acquisition and data processing. As a first step, we evaluated the performance and compared advantages and drawbacks of using free running analog to digital converters (ADCs) and subsequent digital signal processing versus the more traditional technique based on analog signal shaping and peak sensing ADCs. The main goal of the optimization process is to preserve the excellent performance of LaBr3 detectors not only in controlled laboratory condition, but also during the experimental campaigns. In this work we analyze, estimate and experimentally measure the effect of pulse pile-up for LaBr3 scintillators with respect to the acquisition and processing electronics (analog or digital), for various counting rate of events. Significant improvements are achieved, both for the analog and digital approach and the associated results are presented.
  • Keywords
    analogue-digital conversion; nuclear electronics; readout electronics; scintillation counters; signal processing; LaBr3; analog-to-digital converters; data processing; free running ADC; lanthanum bromide scintillation detectors; processing electronics; pulse pile-up effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-2028-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2012.6551103
  • Filename
    6551103