An improved approach to fault tolerant rank order filtering on a SIMD mesh processor

Author

Kim, Jai-Hoon ; Lombardi, Fabrizio ; Vaidya, Nitin H.

Author_Institution

Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA

fYear

1995

fDate

13-15 Nov 1995

Firstpage

137

Lastpage

145

Abstract

This paper presents an approach for the fault tolerant computation of the rank order filtering on a SIMD (Single Instruction Multiple Data) mesh processes such as the MasPar. The proposed approach improves over a previous approach in two respects: by changing the data dependency in the execution of the rank order filtering, a new algorithm with constant execution time complexity can be designed; and by introducing a dependency for the rank values of faulty PEs as computed by neighboring (fault free) processing elements (PEs), a lower distortion can be achieved for enhancement of the image

Keywords

VLSI; digital filters; fault tolerant computing; image enhancement; parallel processing; MasPar; SIMD mesh processor; constant execution time complexity; data dependency; distortion; fault tolerant rank order filtering; image enhancement; processing elements; single instruction multiple data; Circuit faults; Computer science; Concurrent computing; Digital filters; Digital images; Fault tolerance; Fault tolerant systems; Filtering; Image processing; Signal processing algorithms;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 1995. Proceedings., 1995 IEEE International Workshop on,

Conference_Location

Lafayette, LA

ISSN

1550-5774

Print_ISBN

0-8186-7107-6

Type

conf

DOI

10.1109/DFTVS.1995.476946

Filename

476946