DocumentCode :
2544732
Title :
Energy dependence of scintillation decay time measured with gamma-rays and compton electrons
Author :
Swiderski, L. ; Iwanowska, J. ; Moszynski, M. ; Sibczynski, P. ; Szawlowski, M. ; Szczesniak, T.
Author_Institution :
Nat. Centre for Nucl. Res., Otwock-Swierk, Poland
fYear :
2012
fDate :
Oct. 27 2012-Nov. 3 2012
Firstpage :
302
Lastpage :
304
Abstract :
The relation between non proportional response of the scintillators and their energy resolution has been extensively studied in the last years. However, there is not much data on the scintillation decay characteristics as a function of the energy deposited in the scintillator. This study presents a simple experimental setup for direct registration of the scintillation pulse shapes. The tested scintillators are coupled to a photomultiplier. Anode pulses are recorded directly by a digital oscilloscope. The scope is triggered by a logic signal from a single channel analyzer, employed to ensure precise selection of the energy deposit. The study is aimed at investigating the decay time constants and intensities of scintillation decay components as a function of the energy deposited in the scintillator. The differences in the pulse shapes generated in the Compton scattering and photoabsorption processes are also inspected. In this study we present the results of the test case study performed for NaI:TI scintillator.
Keywords :
Compton effect; photoexcitation; photomultipliers; solid scintillation detectors; Compton electrons; Compton scattering process; NaI:TI scintillator; anode pulses; digital oscilloscope; energy resolution; gamma-rays; logic signal; photoabsorption process; photomultiplier; scintillation decay characteristics; scintillation decay components; scintillation decay time; scintillation pulse shapes; scintillator proportional response; single channel analyzer; NaI:Tl; electron response; gamma-ray; scintillation decay time;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
978-1-4673-2028-3
Type :
conf
DOI :
10.1109/NSSMIC.2012.6551111
Filename :
6551111
Link To Document :
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