Title :
Scintillation characterizations of Rb2LiGdCl6: Ce3+ single crystals
Author :
Rooh, Gul ; Kim, H.J. ; Park, Heejung ; Sunghwan Kim ; Sang Jun Kang
Author_Institution :
Dept. of Phys., Abdul Wali Khan Univ., Mardan, Pakistan
fDate :
Oct. 27 2012-Nov. 3 2012
Abstract :
In the present work, we reported on the scintillation characterizations of our newly developed cerium doped Rb2LiGdCl6 (RLGC) single crystal. RLGC belongs to elpasolite family and is grown by vertical Bridgman technique with 0% and 1% Ce3+ contents (mole %). Under X-ray excitation, two overlapped emission peaks are obtained between 350 to 450 nm wavelengths for 1% Ce sample. Such emission is attributed to cerium ion present in the crystal matrix. At 662 keV γ-rays RLGC: 1% Ce3+ crystal showed energy resolution and light yield of 8.1% (FWHM) and ~13,000 ph/MeV, respectively at room temperature. Under γ-ray excitation, RLGC: 1% Ce3+ crystal showed three exponential decay time components. Further improvement in the scintillation properties is expected with higher values of Ce- concentrations. A major drawback of this material is the presence of 87Rb radioisotope and its highly hygroscopic nature. However, the presence of Li and Gd ions in the matrix make this material suitable candidate for the use of thermal neutron detection.
Keywords :
crystal growth from melt; crystal structure; excited states; gadolinium compounds; gamma-ray effects; lithium compounds; radioisotopes; rubidium compounds; scintillation; γ-ray excitation; 87Rb; 87Rb radioisotope; FWHM; Gd ions; Li ions; Rb2LiGdCl6:Ce3+; Rb2LiGdCl6:Ce3+ single crystals; X-ray excitation; cerium ion; crystal matrix; electron volt energy 662 keV; elpasolite family; energy resolution; exponential decay time components; hygroscopic nature; light yield; overlapped emission peaks; scintillation characterization; temperature 293 K to 298 K; thermal neutron detection; vertical Bridgman technique; wavelength 350 nm to 450 nm;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-2028-3
DOI :
10.1109/NSSMIC.2012.6551114