Title :
Single Event Upset energy dependence in a buck-converter power supply design
Author :
Drake, Gryphon ; De Lurgio, P. ; Gopalakrishnan, A. ; Mahadik, S. ; Mellado, B. ; Proudfoot, J. ; Reed, Robert ; Senthilkumaran, A. ; Stanek, R.
Author_Institution :
Argonne Nat. Lab., Chicago, IL, USA
fDate :
Oct. 27 2012-Nov. 3 2012
Abstract :
We present a study of Single Event Upsets (SEU) performed on a commercial pulse-width modulator controller chip for switching power supplies. We performed tests to study the probability of an SEU occurring as a function of incident particle (hadron) energy. We discuss the performance of the circuit, and present a solution using external circuitry to effectively eliminate the effect.
Keywords :
PWM power convertors; hadrons; microprocessor chips; power supply circuits; SEU; buck-converter; energy dependence; hadron; incident particle energy; pulse-width modulator controller chip; single event upset; switching power supplies;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-2028-3
DOI :
10.1109/NSSMIC.2012.6551129
