Title :
MUSE - 525 Progressive Scan Converter
Author :
Nakayama, Hiroki ; Mizutani, Y. ; Yamamoto, H. ; Takagi, M. ; Miki, S.
Author_Institution :
Mitsubishi Electric Corporation
Keywords :
Circuit testing; Costs; Decoding; Detection algorithms; Filters; Hardware; Interference; Signal resolution; System testing; TV;
Conference_Titel :
Consumer Electronics, 1992. Digest of Technical Papers. ICCE., IEEE 1992 International Conference on
Conference_Location :
Rosemont, IL, USA
Print_ISBN :
0-7803-0479-9
DOI :
10.1109/ICCE.1992.697169
