• DocumentCode
    2545256
  • Title

    4π field of view active collimation imager

  • Author

    Taewoong Lee ; Wonho Lee

  • Author_Institution
    Radiologic Sci. Dept., Korea Univ., Seoul, South Korea
  • fYear
    2012
  • fDate
    Oct. 27 2012-Nov. 3 2012
  • Firstpage
    409
  • Lastpage
    411
  • Abstract
    Mechanical collimation commonly uses the photoelectric effect to reconstruct the radiation images. Electronic collimation (Le., Compton camera) using Compton scattering has been developed to reconstruct radiation images without utilizing mechanical collimators. In general, these kinds of instrument for radiation imaging are used individually, or in order to increase the quality of imaging and radiation detection efficiency, the combination method of each imaging from individual instrument is chosen. In this work, however, we developed the active collimation method including 4n field of view (FOV), which is a new collimation technique using two collimation methods simultaneously without additional detection modules. The 4n FOV active collimation detector consisted of a bismuth germanate (BGO) scintillator detector, a mechanical collimator and five detectors composed of CsI(Na) scintillator. The whole detection module formed a cubic pattern to detect radiation from all incident directions. Therefore, the radiation detection efficiency of the developed device was approximately 7-8-fold higher than that of the previously developed system.
  • Keywords
    Compton effect; collimators; image reconstruction; image resolution; photoelectricity; radiation detection; solid scintillation detectors; 4pi field-of-view active collimation imager; Compton camera; Compton scattering; CsI(Na) scintillator; bismuth germanate scintillator detector; electronic collimation; imaging quality; mechanical collimators; photoelectric effect; radiation detection efficiency; radiation image reconstruction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-2028-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2012.6551135
  • Filename
    6551135