DocumentCode
2545379
Title
Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling
Author
Méndez, Miguel A. ; Mateo, Diego ; Aragonès, Xavier ; González, Jose Luis
Author_Institution
Electron. Eng. Dept., UPC, Barcelona, Spain
fYear
2005
fDate
12-16 Sept. 2005
Firstpage
105
Lastpage
108
Abstract
The present work addresses the investigation of phase noise degradation of LC-tank VCOs due to realistic digitally originated substrate noise. The dominant mechanisms by which this noise is coupled to the output of the oscillator due to the substrate and the package are analyzed, indicating that both noise at low frequencies and at high frequencies around the oscillation fundamental significantly degrade phase noise.
Keywords
CMOS integrated circuits; UHF integrated circuits; UHF oscillators; integrated circuit noise; phase noise; voltage-controlled oscillators; LC-tank VCO; package coupling; phase noise degradation; substrate noise; voltage controlled oscillators; Circuit noise; Circuit testing; Coupling circuits; Degradation; Digital circuits; Low-frequency noise; Packaging; Phase noise; Radio frequency; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2005. ESSCIRC 2005. Proceedings of the 31st European
Print_ISBN
0-7803-9205-1
Type
conf
DOI
10.1109/ESSCIR.2005.1541569
Filename
1541569
Link To Document