DocumentCode
2545400
Title
Challenges to Accuracy for the Design of Deep-Submicron RF-CMOS Circuits
Author
Yoshitomi, Sadayuki
Author_Institution
Microelectron. Centre, Toshiba Corp. Semicond. Co., Kawasaki
fYear
2007
fDate
23-26 Jan. 2007
Firstpage
438
Lastpage
441
Abstract
Two challenges for the accurate prediction of GHz CMOS analog/RF building blocks are presented. Challenging the usage of new compact MOSFET models enhances the simulation accuracy. The capability of EKV3.0 model has been studied by applying to TOSHIBA´S 130nm RF-CMOS technology. The verification facts have shown that EKV3.0 model offered excellent modeling capability of both DC and RF (small and large signal). Challenging the efficient use of electro-magnetic (EM) with one practical setup offered successful prediction of the EM effects in the chip. Enhanced study of EM co-simulation technique that links two challenges had shown the perfect prediction of the TOSHIBA´S RF-CMOS circuit (VCO).
Keywords
CMOS analogue integrated circuits; integrated circuit design; radiofrequency integrated circuits; 130 nm; EKV3.0 model; MOSFET models; RF-CMOS analog circuits; building blocks; deep submicron; electro magnetic effects; CMOS technology; Electrons; MOSFET circuits; Predictive models; Radio frequency; Semiconductor device modeling; Silicides; Silicon; Voltage; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
Conference_Location
Yokohama
Print_ISBN
1-4244-0629-3
Electronic_ISBN
1-4244-0630-7
Type
conf
DOI
10.1109/ASPDAC.2007.358025
Filename
4196071
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