• DocumentCode
    2545400
  • Title

    Challenges to Accuracy for the Design of Deep-Submicron RF-CMOS Circuits

  • Author

    Yoshitomi, Sadayuki

  • Author_Institution
    Microelectron. Centre, Toshiba Corp. Semicond. Co., Kawasaki
  • fYear
    2007
  • fDate
    23-26 Jan. 2007
  • Firstpage
    438
  • Lastpage
    441
  • Abstract
    Two challenges for the accurate prediction of GHz CMOS analog/RF building blocks are presented. Challenging the usage of new compact MOSFET models enhances the simulation accuracy. The capability of EKV3.0 model has been studied by applying to TOSHIBA´S 130nm RF-CMOS technology. The verification facts have shown that EKV3.0 model offered excellent modeling capability of both DC and RF (small and large signal). Challenging the efficient use of electro-magnetic (EM) with one practical setup offered successful prediction of the EM effects in the chip. Enhanced study of EM co-simulation technique that links two challenges had shown the perfect prediction of the TOSHIBA´S RF-CMOS circuit (VCO).
  • Keywords
    CMOS analogue integrated circuits; integrated circuit design; radiofrequency integrated circuits; 130 nm; EKV3.0 model; MOSFET models; RF-CMOS analog circuits; building blocks; deep submicron; electro magnetic effects; CMOS technology; Electrons; MOSFET circuits; Predictive models; Radio frequency; Semiconductor device modeling; Silicides; Silicon; Voltage; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    1-4244-0629-3
  • Electronic_ISBN
    1-4244-0630-7
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2007.358025
  • Filename
    4196071