A high-quality sine-wave oscillator for analog built-in self-testing

Author

Domínguez, M.A. ; Ausín, J.L. ; Duque-Carillo, J.F. ; Torelli, G.

Author_Institution

Dept. of Electron. & Electr. Eng., Extremadura Univ., Badajoz

fYear

2006

fDate

21-24 May 2006

Lastpage

3457

Abstract

This paper describes a high-quality switched-capacitor sine-wave oscillator for on-chip analog testing. At the core of the oscillator is a high-Q bandpass filter whose selectivity is programmed by using a non-uniform sampling scheme. As a result, capacitor spread and total capacitor area can be reduced and, hence, test area overhead is minimized. Experimental results from a 0.35-mum CMOS test-chip that generates signals with frequencies up to 1 MHz are presented

Keywords

CMOS integrated circuits; Q-factor; analogue integrated circuits; band-pass filters; built-in self test; integrated circuit testing; oscillators; switched capacitor networks; 0.35 micron; CMOS test chip; analog built-in self-testing; capacitor spread; high-Q bandpass filter; nonuniform sampling; on-chip analog testing; switched capacitor sine-wave oscillator; test area overhead; total capacitor area; Band pass filters; Built-in self-test; Capacitors; Circuit optimization; Circuit testing; Electronic equipment testing; Frequency synchronization; Oscillators; Signal generators; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on

Conference_Location

Island of Kos

Print_ISBN

0-7803-9389-9

Type

conf

DOI

10.1109/ISCAS.2006.1693369

Filename

1693369