DocumentCode :
2545704
Title :
A novel direct approach for blind source separation based on the characteristic function
Author :
Yeredor, Arie
Author_Institution :
Dept. of Electr. Eng.-Syst., Tel Aviv Univ., Israel
fYear :
2000
fDate :
2000
Firstpage :
365
Lastpage :
369
Abstract :
We propose a new “direct-form” algorithm for blind source separation. In contrast to “iterative-form” algorithms, in a “direct-form” algorithm the mixing matrix is estimated directly from the observed data, using a single pass to collect some statistics. The statistics exploited by our algorithm are the empirical second-derivative matrices of the second joint characteristic function of the observations, evaluated at selected points, termed “processing points”. Applying approximate joint diagonalization to these matrices yields a consistent estimate of the mixing matrix (under some mild regularity conditions) in the noiseless as well as in the noisy case, whenever the noise is Gaussian and spatially white. For spatially correlated Gaussian noise, a slightly modified version of the algorithm can still produce consistent estimates. The performance depends strongly on the choice of processing points, and can compare favorably to other BSS algorithms
Keywords :
AWGN; array signal processing; correlation methods; matrix algebra; signal reconstruction; statistical analysis; approximate joint diagonalization; array signal processing; blind source separation; direct-form algorithm; mixing matrix estimation; observed data; performance; processing points; regularity conditions; second joint characteristic function; second-derivative matrices; source signal reconstruction; spatially correlated Gaussian noise; spatially white Gaussian noise; statistics; Additive noise; Blind source separation; Decorrelation; Gaussian noise; Proposals; Source separation; Statistics; Time domain analysis; Vectors; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensor Array and Multichannel Signal Processing Workshop. 2000. Proceedings of the 2000 IEEE
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-6339-6
Type :
conf
DOI :
10.1109/SAM.2000.878031
Filename :
878031
Link To Document :
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