DocumentCode :
2545745
Title :
The performance of recently developed high voltage high current power transistors
Author :
Lamm, J.L. ; Konnan, Y.A.
Author_Institution :
Solitron Devices, Inc., Riviera Beach, FL, USA
fYear :
1972
fDate :
22-23 May 1972
Firstpage :
160
Lastpage :
163
Abstract :
A new generation of planar high voltage, high current transistors has evolved which makes use of new high current density techniques. The resulting transistors have already been made with Collector to Base breakdown voltages of over 1500 volts and Collector to Emitter sustaining (base terminal open circuit) voltages of over 1000 volts. The high current density techniques have permitted current capabilities of 60 amperes, combined with sustaining voltages over 400volts on a single chip transistor.
Keywords :
power transistors; collector to base breakdown voltages; collector to emitter sustaining voltages; high current density techniques; high voltage high current power transistors; Conductivity; Current measurement; Doping; Electric breakdown; Epitaxial growth; Integrated circuits; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Specialists Conference, 1972 IEEE
Conference_Location :
Atlantic City
ISSN :
0275-9306
Type :
conf
DOI :
10.1109/PPESC.1972.7094900
Filename :
7094900
Link To Document :
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