Title :
Charge pump detector: Optimization with process and device simulation
Author :
Segal, Julie D. ; Kenney, C.J.
Author_Institution :
SLAC Nat. Accel. Lab., Menlo Park, CA, USA
fDate :
Oct. 27 2012-Nov. 3 2012
Abstract :
The charge pump pixel detector concept was developed to meet the requirements of X-ray correlation spectroscopy. The sensor is built in high-resistivity silicon with front and backside diffused regions and double metal processing on the front side. The design is targeted for low noise of less than 100 e noise, high quantum efficiency for 8KeV photons, 8mS readout for the entire array, and dynamic range of 100 photons. The pixel size is 56μm by 56μm. In the current work, extensive TCAD simulations were used to optimize the device structure, the bias conditions, and the process conditions. 3D simulations under dynamic switching conditions were executed to study charge cloud evolution, charge storage, and readout.
Keywords :
X-ray spectroscopy; charge pump circuits; optimisation; position sensitive particle detectors; semiconductor counters; technology CAD (electronics); TCAD simulation; X-ray correlation spectroscopy; charge cloud evolution; charge pump pixel detector; charge storage; device simulation; high resistivity silicon; optimization; pixel size; process simulation; quantum efficiency; readout;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-2028-3
DOI :
10.1109/NSSMIC.2012.6551158