DocumentCode
2545876
Title
Integrated diagnostics: confusion and solutions
Author
Dean, Jeffrey S.
Author_Institution
SA-ALC/LDAE, San Antonio, TX, USA
fYear
1996
fDate
16-19 Sep 1996
Firstpage
436
Lastpage
440
Abstract
This paper discusses the definition of integrated Diagnostics (ID), and some of the common misconceptions of what constitutes ID. As ID represents a powerful method for ensuring that weapon systems are developed with diagnostics capabilities that are both comprehensive end cost effective several proposals for enhancing and extending its application are proposed
Keywords
automatic testing; economics; fault diagnosis; weapons; built in test; cost effectiveness; integrated diagnostics; military systems; weapon systems; Aging; Analytical models; Cost benefit analysis; Design engineering; Laboratories; Modeling; Proposals; System testing; Systems engineering and theory; Weapons;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
Conference_Location
Dayton, OH
ISSN
1088-7725
Print_ISBN
0-7803-3379-9
Type
conf
DOI
10.1109/AUTEST.1996.547771
Filename
547771
Link To Document