DocumentCode :
2545967
Title :
Optimization of Robust Asynchronous Circuits by Local Input Completeness Relaxation
Author :
Jeong, Cheoljoo ; Nowick, Steven M.
Author_Institution :
Dept. of Comput. Sci., Columbia Univ., New York, NY
fYear :
2007
fDate :
23-26 Jan. 2007
Firstpage :
622
Lastpage :
627
Abstract :
As process, temperature and voltage variations become significant in deep submicron design, timing closure becomes a critical challenge using synchronous CAD flows. One attractive alternative is to use robust asynchronous circuits which gracefully accommodate timing discrepancies. However, these asynchronous circuits typically suffer from high area and latency overhead. In this paper, an optimization algorithm is presented which reduces the area and delay of these circuits by relaxing their overly-restrictive style. The algorithm was implemented and experiments performed on a subset of MCNC circuits. On average, 49.2% of the gates could be implemented in a relaxed manner, 34.9% area improvement was achieved, and 16.1% delay improvement was achieved using a simple heuristic for targeting the critical path in the circuit. This is the first proposed approach that systematically optimizes asynchronous circuits based on the notion of local relaxation while still preserving the circuit´s overall timing-robustness.
Keywords :
asynchronous circuits; logic design; optimisation; deep submicron design; local input completeness relaxation; local relaxation; optimization algorithm; robust asynchronous circuits; synchronous CAD flows; temperature variation; voltage variation; Asynchronous circuits; Cost function; Delay; Design automation; Electromagnetic interference; Logic circuits; Robustness; Temperature; Timing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
Conference_Location :
Yokohama
Print_ISBN :
1-4244-0629-3
Electronic_ISBN :
1-4244-0630-7
Type :
conf
DOI :
10.1109/ASPDAC.2007.358055
Filename :
4196101
Link To Document :
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