• DocumentCode
    2546053
  • Title

    Encapsulation and diagnosis with fault dictionaries

  • Author

    Simpson, William R. ; Sheppard, John W.

  • Author_Institution
    Inst. for Defense Anal., Alexandria, VA, USA
  • fYear
    1996
  • fDate
    16-19 Sep 1996
  • Firstpage
    441
  • Lastpage
    446
  • Abstract
    To date, test and diagnosis has been domain knowledge driven. However, as system complexity grows and we strive to develop reusable components, the concept of encapsulation becomes increasingly important. Encapsulation embodies the concepts of separation and partitioning. In this paper we deal with encapsulation by illustration of the fault dictionary approach to digital electronics. We then extend the concept of encapsulation to the system test approach as well as the development of maintenance systems. Finally we develop the concept that encapsulation is a key element in achieving general standardization open system architectures
  • Keywords
    automatic testing; data encapsulation; fault diagnosis; knowledge based systems; logic testing; military computing; open systems; standardisation; complexity; diagnosis; digital electronics; encapsulation; fault dictionaries; open system architectures; partitioning; reusable components; separation; standardization; Automatic testing; Circuit faults; Circuit testing; Dictionaries; Digital circuits; Digital simulation; Electronic equipment testing; Encapsulation; Fault diagnosis; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
  • Conference_Location
    Dayton, OH
  • ISSN
    1088-7725
  • Print_ISBN
    0-7803-3379-9
  • Type

    conf

  • DOI
    10.1109/AUTEST.1996.547772
  • Filename
    547772