Title :
Charge storage in dielectrics
Author_Institution :
Inst. of Electroacoust., Tech. Univ. of Darmstadt, West Germany
Abstract :
Work on charge-storage processes in dielectrics performed over the past few years is reviewed. Results obtained on polymers with corona, electron-beam and pressure-pulse methods and pertaining to trap filling, spatial distribution of the charge, radiation-induced conductivity, and dynamics of the charge decay are discussed. The generation of a variety of polarization distributions in polyvinylidene fluoride (PVDF) with electron-beam and other methods is reviewed. Some results on charge storage and transport in silicon dioxide are described
Keywords :
EBIC; dielectric polarisation; electron beam effects; electron traps; polymers; reviews; silicon compounds; SiO2; charge decay; charge-storage processes; corona methods; dielectrics; electron beam methods; polarization distributions; polymers; polyvinylidene fluoride; pressure-pulse methods; radiation-induced conductivity; spatial distribution; trap filling; Charge measurement; Corona; Current measurement; Dielectrics; Electron traps; Polarization; Polymers; Surface charging; Surface discharges; Temperature;
Conference_Titel :
Electrets, 1988. (ISE 6) Proceedings., 6th International Symposium on (IEEE Cat. No.88CH2593-2)
Conference_Location :
Oxford
DOI :
10.1109/ISE.1988.38520
