Charge storage in dielectrics

Author

Sessler, G.M.

Author_Institution

Inst. of Electroacoust., Tech. Univ. of Darmstadt, West Germany

fYear

1988

fDate

1-3 Sep 1988

Firstpage

37

Lastpage

46

Abstract

Work on charge-storage processes in dielectrics performed over the past few years is reviewed. Results obtained on polymers with corona, electron-beam and pressure-pulse methods and pertaining to trap filling, spatial distribution of the charge, radiation-induced conductivity, and dynamics of the charge decay are discussed. The generation of a variety of polarization distributions in polyvinylidene fluoride (PVDF) with electron-beam and other methods is reviewed. Some results on charge storage and transport in silicon dioxide are described

Keywords

EBIC; dielectric polarisation; electron beam effects; electron traps; polymers; reviews; silicon compounds; SiO₂; charge decay; charge-storage processes; corona methods; dielectrics; electron beam methods; polarization distributions; polymers; polyvinylidene fluoride; pressure-pulse methods; radiation-induced conductivity; spatial distribution; trap filling; Charge measurement; Corona; Current measurement; Dielectrics; Electron traps; Polarization; Polymers; Surface charging; Surface discharges; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrets, 1988. (ISE 6) Proceedings., 6th International Symposium on (IEEE Cat. No.88CH2593-2)

Conference_Location

Oxford

Type

conf

DOI

10.1109/ISE.1988.38520

Filename

38520