Title :
Advances in measurement techniques for characterizing mid-IR fibers in the 2-12 μm wavelength region
Author :
Sunak, Harish R D ; Bastien, Steven P.
Author_Institution :
Dept. of Electr. Eng., Rhode Island Univ., Kingston, RI, USA
Abstract :
Recent advances that have taken place in laser sources and detectors for use with mid-IR fibers in the 2-12-μm wavelength region are discussed. Emphasis is placed on III-V semiconductor devices. The parameters highlighted are temperature of operation, threshold current density, output power (for lasers), quantum efficiency, modulation response, and dark current (for detectors). It is suggested that much work remains to be done so that these devices can eventually be used in practical systems
Keywords :
III-V semiconductors; infrared detectors; light sources; optical fibres; optical testing; optical variables measurement; photodetectors; semiconductor junction lasers; 2 to 12 micron; III-V semiconductor devices; ZrF4; dark current; detectors; laser sources; mid-IR fibers; modulation response; optical testing; optical variables measurement; output power; quantum efficiency; temperature of operation; threshold current density; Fiber lasers; III-V semiconductor materials; Measurement techniques; Optical fiber devices; Power generation; Power lasers; Semiconductor devices; Semiconductor lasers; Temperature; Threshold current;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1988. IMTC-88. Conference Record., 5th IEEE
Conference_Location :
San Diego, CA
DOI :
10.1109/IMTC.1988.10883
