Title :
Two-dimensional CMOS image sensor characterization
Author :
Shcherback, Igor ; Segal, Razy ; Belenky, Alexander ; Yadid-Pecht, Orly
Author_Institution :
The VLSI Syst. Center, Ben-Gurion Univ., Beer-Sheva
Abstract :
In this work two-dimensional (2-D) measurements obtained by the unique submicron scanning system (S-cube system) for the industrial graded CMOS image sensor (CIS) are presented. Full 2-D point spread function (PSF) extracted for several CIS sub arrays via sub-micron spot light stimulation is used for full sensor characterization; including crosstalk (CTK) generation phenomena, its dependence on the array topology and the "neighborhood" condition, along with a 2-D pixel MTF calculated from the PSF measurements. The degradation of the imager performance caused by the diffusion effects is apparent from the calculated MTF. The effectiveness and advantages of the proposed method are shown; enabling both to determine the influence of each pixel-composing element on its overall signal, along with sensor resolution abilities characterization for each wavelength of interest. The advantages and necessities of 2D-characterization for sensor performance understanding and improvement are clearly emphasized
Keywords :
CMOS image sensors; diffusion; optical crosstalk; optical transfer function; 2D CMOS image sensor; 2D measurements; 2D point spread function; CIS sub arrays; CTK generation; PSF; S-cube system; array topology; crosstalk generation; diffusion; multisensor; sensor performance; sub-micron spot light stimulation; submicron scanning system; CMOS image sensors; Character generation; Computational Intelligence Society; Crosstalk; Optical arrays; Sensor arrays; Sensor phenomena and characterization; Topology; Two dimensional displays; Wavelength measurement;
Conference_Titel :
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location :
Island of Kos
Print_ISBN :
0-7803-9389-9
DOI :
10.1109/ISCAS.2006.1693401
