DocumentCode
2546644
Title
Fast Flip-Chip Pin-Out Designation Respin by Pin-Block Design and Floorplanning for Package-Board Codesign
Author
Lee, Ren-jie ; Lai, Ming-Fang ; Chen, Hung-Ming
Author_Institution
Dept. of Electron. Eng. & SoC Res. Center, Nat. Chiao Tung Univ., Hsinchu
fYear
2007
fDate
23-26 Jan. 2007
Firstpage
804
Lastpage
809
Abstract
Deep submicron effects drive the complication in designing chips, as well as in package designs and communications between package and board. As a result, the iterative interface design has been a time-consuming process. This paper proposes a novel and efficient approach to designating pin-out for flip-chip BGA package when designing chipsets. The proposed approach can not only automate the assignment of more than 200 I/O pins on package, but also precisely evaluate package size which accommodates all pins with almost no void pin positions, as good as the one from manual design. Furthermore, the practical experience and techniques in designing such interface has been accounted for, including signal integrity, power delivery and routability. This efficient pin-out designation and package size estimation by pin-block design and floorplanning provides much faster turn around time, thus enormous improvement in meeting design schedule. The results on two real cases show that our methodology is effective in achieving almost the same dimensions in package size, compared with manual design in weeks, while simultaneously considering critical issues in package-board codesign. To the best of our knowledge, this is the first attempt in solving flip-chip pin-out placement problem in package-board codesign.
Keywords
ball grid arrays; flip-chip devices; integrated circuit design; integrated circuit layout; integrated circuit packaging; chipsets design; deep submicron effects; flip-chip BGA package; flip-chip pin-out designation respin; floorplanning; iterative interface design; package-board codesign; pin-block design; Costs; Design engineering; Electronics packaging; Geometry; Lead; Pins; Printed circuits; Process design; Signal design; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
Conference_Location
Yokohama
Print_ISBN
1-4244-0629-3
Electronic_ISBN
1-4244-0630-7
Type
conf
DOI
10.1109/ASPDAC.2007.358088
Filename
4196134
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