• DocumentCode
    2546917
  • Title

    Behavioral Fault Model for Neural Networks

  • Author

    Ahmadi, A. ; Fakhraie, S.M. ; Lucas, C.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran
  • Volume
    2
  • fYear
    2009
  • fDate
    22-24 Jan. 2009
  • Firstpage
    71
  • Lastpage
    75
  • Abstract
    The term neural network (NN) originally referred to a network of interconnected neurons which are basic building blocks of the nervous system. Fault tolerance is known as an inherent feature of artificial neural networks (ANNs). Wide attention has been given to the problem of fault-tolerance in VLSI implementation domain and not enough attention has been paid to intrinsic capacity of survival to faults. In this work we focus on the impact of faults on the neural computation in order to show neural paradigms cannot be considered intrinsically fault-tolerant. A high abstraction level (corresponding to the neural graph) error model is introduced in this paper. We propose fault model and present an analysis of the usability of our method for fault masking. Simulation results show with this new fault model, the fault with less significant contribution is masked in output.
  • Keywords
    VLSI; fault tolerance; neural chips; VLSI; behavioral fault model; fault masking; fault tolerance; neural computation; neural graph error model; neural network; Artificial neural networks; Biological neural networks; Circuit faults; Computer networks; Fault tolerance; Intelligent networks; Multi-layer neural network; Neural network hardware; Neural networks; Neurons; Neural networks; fault model; fault-tolerancee;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Engineering and Technology, 2009. ICCET '09. International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-3334-6
  • Type

    conf

  • DOI
    10.1109/ICCET.2009.201
  • Filename
    4769561