DocumentCode
2546917
Title
Behavioral Fault Model for Neural Networks
Author
Ahmadi, A. ; Fakhraie, S.M. ; Lucas, C.
Author_Institution
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran
Volume
2
fYear
2009
fDate
22-24 Jan. 2009
Firstpage
71
Lastpage
75
Abstract
The term neural network (NN) originally referred to a network of interconnected neurons which are basic building blocks of the nervous system. Fault tolerance is known as an inherent feature of artificial neural networks (ANNs). Wide attention has been given to the problem of fault-tolerance in VLSI implementation domain and not enough attention has been paid to intrinsic capacity of survival to faults. In this work we focus on the impact of faults on the neural computation in order to show neural paradigms cannot be considered intrinsically fault-tolerant. A high abstraction level (corresponding to the neural graph) error model is introduced in this paper. We propose fault model and present an analysis of the usability of our method for fault masking. Simulation results show with this new fault model, the fault with less significant contribution is masked in output.
Keywords
VLSI; fault tolerance; neural chips; VLSI; behavioral fault model; fault masking; fault tolerance; neural computation; neural graph error model; neural network; Artificial neural networks; Biological neural networks; Circuit faults; Computer networks; Fault tolerance; Intelligent networks; Multi-layer neural network; Neural network hardware; Neural networks; Neurons; Neural networks; fault model; fault-tolerancee;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Engineering and Technology, 2009. ICCET '09. International Conference on
Conference_Location
Singapore
Print_ISBN
978-1-4244-3334-6
Type
conf
DOI
10.1109/ICCET.2009.201
Filename
4769561
Link To Document