A novel circuit topology for generating and validating digitally sense amplifier differentials for bulk and SOI

In this paper, a novel programmable voltage divider circuit is proposed for converting digital signals to differential (analog) signals which can be used to evaluate differential sense amplifies in the absence of SRAM cells for the first time. The differentials can be programmable and switchable to reverse polarity. A circuit utilizing this scheme is also proposed to test variety of differential circuits having small signal inputs. The digital input is used to generate analog signals to drive the differential circuits; results are then validated digitally to alleviate more complicated testing problems. The novel circuit technique is implemented in hardware and test results are corroborated with simulations. The circuit functions both in bulk and silicon on insulator (SOI) technologies.