Title :
Parameter studies and analysis of high efficiency Cu(In,Ga)Se2 based solar cells
Author :
Walter, T. ; Menner, Richard ; Ruckh, M. ; Schock, H.W.
Author_Institution :
Inst. fuer Phys. Elektronik, Stuttgart Univ.
Abstract :
Solar cells based on Cu(In,Ga)Se2 with gallium contents of 20% and 40% have been prepared and analyzed. Efficiencies exceeding 12% have been obtained. This contribution focuses on XRD, XPS and UPS analysis of these films. The influence of morphology, orientation of the grains, bulk composition, and secondary phases detected by surface analysis on the solar cell characteristics are presented and discussed. The existence of a metallic behavior on the Cu-rich side is shown and correlated to a shift in the Auger structure of Se and Cu. The possibility of passivating oxides is demonstrated
Keywords :
X-ray diffraction examination of materials; X-ray photoelectron spectra; copper compounds; gallium compounds; indium compounds; semiconductor thin films; solar cells; ternary semiconductors; ultraviolet photoelectron spectra; Auger structure; CuIn1-xGaxSe2 solar cells; UPS; X-ray diffraction analysis; X-ray photoelectron spectra analysis; XPS; XRD; bulk composition; grain orientation; morphology; passivating oxides; secondary phases; semiconductor thin films; surface analysis; ultraviolet photoelectron spectroscopy; Energy measurement; Kinetic energy; Measurement standards; Morphology; Photovoltaic cells; X-ray scattering;
Conference_Titel :
Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-87942-636-5
DOI :
10.1109/PVSC.1991.169344
