Frequency Domain Testing: A New Approach in Online Test of VLSI Digital Signal Processing Systems

Author

Yousefi, R. ; Jalili, A. ; Fakhraie, S.M.

Author_Institution

Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran

Volume

2

fYear

2009

fDate

22-24 Jan. 2009

Firstpage

136

Lastpage

140

Abstract

A new implementation of frequency domain online test approach is proposed for general digital linear time-invariant(LTI) systems. An analytical signal processing approach is used to extract the online test relation of LTI systems in frequency domain. An optimal implementation of the developed technique is proposed using sliding Goertzel DFT to reduce area and computational overheads with minimum error detection latency. Finite-precision analysis is done for fixed-point implementation of the proposed technique. The overhead is fixed and does not increase as complexity of LTI system increases. Simulation of fault detection capability is done for different filters using developed FLI fault injector platform.

Keywords

VLSI; discrete Fourier transforms; frequency-domain analysis; integrated circuit testing; linear systems; logic testing; signal processing; digital linear time-invariant system; discrete Fourier transform; finite-precision analysis; frequency domain testing; minimum error detection latency; online VLSI digital signal processing system testing; sliding Goertzel DFT; Computational modeling; Delay; Digital signal processing; Fault detection; Filters; Frequency domain analysis; Signal analysis; Signal processing; System testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Engineering and Technology, 2009. ICCET '09. International Conference on

Conference_Location

Singapore

Print_ISBN

978-1-4244-3334-6

Type

conf

DOI

10.1109/ICCET.2009.198

Filename

4769574