Title :
Frequency Domain Testing: A New Approach in Online Test of VLSI Digital Signal Processing Systems
Author :
Yousefi, R. ; Jalili, A. ; Fakhraie, S.M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran
Abstract :
A new implementation of frequency domain online test approach is proposed for general digital linear time-invariant(LTI) systems. An analytical signal processing approach is used to extract the online test relation of LTI systems in frequency domain. An optimal implementation of the developed technique is proposed using sliding Goertzel DFT to reduce area and computational overheads with minimum error detection latency. Finite-precision analysis is done for fixed-point implementation of the proposed technique. The overhead is fixed and does not increase as complexity of LTI system increases. Simulation of fault detection capability is done for different filters using developed FLI fault injector platform.
Keywords :
VLSI; discrete Fourier transforms; frequency-domain analysis; integrated circuit testing; linear systems; logic testing; signal processing; digital linear time-invariant system; discrete Fourier transform; finite-precision analysis; frequency domain testing; minimum error detection latency; online VLSI digital signal processing system testing; sliding Goertzel DFT; Computational modeling; Delay; Digital signal processing; Fault detection; Filters; Frequency domain analysis; Signal analysis; Signal processing; System testing; Very large scale integration;
Conference_Titel :
Computer Engineering and Technology, 2009. ICCET '09. International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-3334-6
DOI :
10.1109/ICCET.2009.198
