• DocumentCode
    2547253
  • Title

    Fast analog front-end for the readout of the SuperB SVT inner Layers

  • Author

    Traversi, Gianluca ; Gaioni, L. ; Manghisoni, Massimo ; Ratti, Lodovico ; Re, V.

  • Author_Institution
    Dipt. di Ing., Univ. di Bergamo, Dalmine, Italy
  • fYear
    2012
  • fDate
    Oct. 27 2012-Nov. 3 2012
  • Firstpage
    841
  • Lastpage
    847
  • Abstract
    The SuperB factory is an Italian e+ e- accelerator project that plans to reach a luminosity higher than 1036 cm-2s-1 by means of a very small beam size and with moderate beam currents. To achieve the performance imposed by physics, six layers of microstrip silicon sensors, with different pitches and lengths, are foreseen in the present design of the Silicon Vertex Tracker (SVT). The SuperB SVT readout chip for inner Layers (L0-L3) is a 128-channel mixed-signal integrated circuit in a 130 nm CMOS technology. Each channel consists of a charge-sensitive preamplifier, a second order unipolar semi-Gaussian shaper, a baseline restorer and a hit discriminator. A 4 bit A/D conversion will be performed by means of the Time-Over-Threshold (ToT) technique. This paper presents the solutions adopted in this chip for the analog channel building blocks and discusses the simulation results for the current design along with the expected performance in terms of parameters such as signal-to-noise ratio, dynamic range, linearity, power dissipation and hit time resolution.
  • Keywords
    CMOS integrated circuits; microstrip circuits; particle accelerators; position sensitive particle detectors; readout electronics; semiconductor counters; CMOS technology; Silicon Vertex Tracker; SuperB SVT Inner Layers readout; SuperB factory; Time-Over-Threshold technique; ToT technique; beam size; charge sensitive preamplifier; fast analog front end; luminosity; microstrip silicon sensors; positron+electron accelerator project; semiGaussian shaper; CMOS; SVT; front-end electronics; noise; silicon strip detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-2028-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2012.6551223
  • Filename
    6551223