• DocumentCode
    2547422
  • Title

    Time-over-threshold processing implementation for silicon detectors with large capacitances

  • Author

    Kasinski, Krzysztof ; Kleczek, R. ; Grybos, Pawel ; Szczygiel, Robert

  • Author_Institution
    Dept. of Meas. & Instrum., AGH Univ. of Sci. & Technol., Krakow, Poland
  • fYear
    2012
  • fDate
    Oct. 27 2012-Nov. 3 2012
  • Firstpage
    882
  • Lastpage
    885
  • Abstract
    Modern High Energy Physics experiments require more functionality from the multichannel readout circuits which in conjunction with strict limits on power consumption, area occupation and low noise performance set new requirements in the analog front-end electronics design. We discuss the applicability issues and design challenges of a constant-current discharge time-over-threshold (ToT) processing chain for readout of the large capacitance silicon strip detectors. The conclusions are based on measurement results of two prototype ASICs: TOTOl, TOT02. The revealed non-idealities and issues have been identified and are briefly presented in this paper. Moreover, an idea for charge amplifiaction, measurement and timestamping is proposed as a possible remedy for presented matters. This conception uses two cascaded amplifiers and exploits advantages of two different feedback circuits to eliminate the negative impact of a large detector capacitance on the performance of ToT processing while keeping the power consumption at low level.
  • Keywords
    capacitance; nuclear electronics; readout electronics; silicon radiation detectors; analog front-end electronics design; area occupation; charge amplifiaction; constant-current discharge time-over-threshold processing chain; feedback circuits; large capacitance silicon strip detectors; low noise performance set; modern high energy physics experiments; multichannel readout circuits; power consumption; prototype ASIC; silicon detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-2028-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2012.6551232
  • Filename
    6551232