Title :
Leakage energy reduction techniques in deep submicron cache memories: a comparative study
Author :
Frustaci, Fabio ; Corsonello, Pasquale ; Perri, Stefania ; Cocorullo, Giuseppe
Author_Institution :
Dept. of Electron., Comput. Sci. & Syst., Calabria Univ., Rende
Abstract :
Static energy consumption due to subthreshold leakage current is one of the main concern in on-chip level-1 and level-2 cache. In the last few years several techniques have been proposed to limit the subthreshold current in a SRAM cell. Unfortunately, these techniques also increase the dynamic energy during the cell access operation, with respect to the conventional SRAM architecture. In this paper the actual energy saving offered by low leakage approaches is investigated, within the context of a microprocessor memory hierarchy, taking into account their dynamic energy overheads. Simulation based on UMC 0.18mum-1.8V and ST 90nm-1V process models have been performed. Results show that, for both the technologies, the leakage energy saving achieved by the analyzed techniques in the first cache level turns out to be inadequate, owing to the extra dynamic energy dissipation. Only in UL2 they assure a net energy saving due to the smaller number of accesses
Keywords :
SRAM chips; cache storage; leakage currents; microprocessor chips; 0.18 micron; 1 V; 1.8 V; 90 nm; SRAM architecture; deep submicron cache memories; leakage current; leakage energy reduction techniques; microprocessor memory hierarchy; Cache memory; Circuit simulation; Computer science; Delay; Energy consumption; Leakage current; Microprocessors; Power dissipation; Random access memory; Subthreshold current;
Conference_Titel :
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location :
Island of Kos
Print_ISBN :
0-7803-9389-9
DOI :
10.1109/ISCAS.2006.1693467