• DocumentCode
    2547868
  • Title

    Further insight into the measured equation of invariance EM theory

  • Author

    Mei, K.K. ; Pous, R. ; Prouty, M. ; Liu, Y.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • fYear
    1993
  • fDate
    June 28 1993-July 2 1993
  • Firstpage
    544
  • Abstract
    The measured equation of invariance (MEI) is a concept in field computation which leads to the generation of local linear equations in lieu of absorption conditions to terminate finite difference or finite element equations. The advantage of the method is that the equations are not limited to replacing absorbing conditions, but can be used where there are both outgoing and incoming waves. In fact, they can be used in closed or semiclosed environments such as cavities or waveguides. Yet unlike the integral equation or boundary element method, which results in global matrices, MEI gives local equations and sparse matrices. The savings in storage and computing time by MEI over conventional methods are very substantial.<>
  • Keywords
    computational complexity; electromagnetic field theory; electromagnetic wave scattering; finite difference methods; finite element analysis; invariance; sparse matrices; waveguide theory; 2D scattering problem; EM theory; cavities; computing time; field computation; finite difference equations; finite element equations; local linear equations; measured equation of invariance; savings in storage; sparse matrices; waveguides; Absorption; Difference equations; Electric variables measurement; Finite difference methods; Finite element methods; Geometry; Integral equations; Scattering; Sparse matrices; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
  • Conference_Location
    Ann Arbor, MI, USA
  • Print_ISBN
    0-7803-1246-5
  • Type

    conf

  • DOI
    10.1109/APS.1993.385288
  • Filename
    385288