Title :
Constructions of the SbEC-DbED and DbEC codes, and their applications
Author :
Feng, G.L. ; Xiao, Sihai ; Shi, Xiaofa ; Rao, T.R.N.
Author_Institution :
Center for Adv. Comput. Studies, Southwestern Louisiana Univ., Lafayette, LA, USA
Abstract :
Error control codes are now successfully applied to memory systems in order to enhance the system reliability. Among the error control codes, the distance-4 codes and the distance-5 codes are two of the most important classes of error control codes in the computer applications. For example, these two types of codes can be used to construct Error-Locating codes which have been applied to identify the faulty module for fault isolation and reconfiguration in fault-tolerant computer systems. The well known constructions for these two types of codes mere proposed by Chen [1986]. In this paper, we propose new construction schemes and decoding schemes for these two types of codes. The proposed constructions are able to improve the code lengths of Chen´s codes, and the proposed decoding schemes are efficient
Keywords :
decoding; error correction codes; error detection codes; fault diagnosis; fault tolerant computing; reliability; DbEC codes; SbEC-DbED codes; code lengths; construction schemes; decoding schemes; distance-4 codes; distance-5 codes; double b-bit error detection; error control codes; error-locating codes; fault isolation; faulty module; memory systems; reconfiguration; single b-bit byte error correction; system reliability; Application software; Computer applications; Computer errors; Decoding; Error correction; Error correction codes; Fault diagnosis; Fault tolerant systems; Random access memory; Reliability;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1995. Proceedings., 1995 IEEE International Workshop on,
Conference_Location :
Lafayette, LA
Print_ISBN :
0-8186-7107-6
DOI :
10.1109/DFTVS.1995.476962
